Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6393915 | Method and device for simultaneously measuring multiple properties of multilayer films | Robin Anne Sacco | 2002-05-28 |
| 6348967 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, John A. Rogers, John Hanselman, Martin Fuchs | 2002-02-19 |