SN

Syun Noguchi

TC Tokyo Seimitsu Co.: 1 patents #6 of 19Top 35%
Overall (2002): #110,137 of 266,432Top 45%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6456318 Defect inspection apparatus and method by comparing two pairs of areas adjacent to one another 2002-09-24