Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6484306 | Multi-level scanning method for defect inspection | Seongtae Jeong | 2002-11-19 |
| 6413802 | Finfet transistor structures having a double gate channel extending vertically from a substrate and methods of manufacture | Chenming Hu, Tsu-Jae King, Vivek Subramanian, Leland Chang, Xuejue Huang +4 more | 2002-07-02 |