Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6438718 | Wordline stress mode arrangement a storage cell initialization scheme test time reduction burn-in elimination | — | 2002-08-20 |
| 6353563 | Built-in self-test arrangement for integrated circuit memory devices | Kuong Hua Hii, Theo J. Powell | 2002-03-05 |