Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6418070 | Memory device tester and method for testing reduced power states | Matthew R. Harrington, Van Huynh | 2002-07-09 |
| 6373127 | Integrated capacitor on the back of a chip | Daniel Baudouin, Akitoshi Nishimura, Jeffrey W. Janzen, Mark A. Kressley | 2002-04-16 |