Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6389323 | Method and system for yield loss analysis by yield management system | Jiunn-Der Yang, Chao-Hsin Chang, Wen-Chen Chang | 2002-05-14 |
RY
Renn-Shyan Yeh
Overall (2002): #133,526 of 266,432Top 55%
1
Patents 2002