Issued Patents 2002
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6494079 | Method and apparatus for characterizing materials by using a mechanical resonator | Leonid Matsiev, Eric McFarland | 2002-12-17 |
| 6477479 | Sensor array for rapid materials characterization | Paul Mansky | 2002-11-05 |
| 6438497 | Method for conducting sensor array-based rapid materials characterization | Paul Mansky | 2002-08-20 |
| 6393895 | Method and apparatus for characterizing materials by using a mechanical resonator | Leonid Matsiev, Eric McFarland | 2002-05-28 |
| 6371640 | Apparatus and method for characterizing libraries of different materials using X-ray scattering | Damian Hajduk, Rakesh Jain | 2002-04-16 |
| 6336353 | Method and apparatus for characterizing materials by using a mechanical resonator | Leonid Matsiev, Eric McFarland | 2002-01-08 |