Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6400175 | Method of testing semiconductor integrated circuits and testing board for use therein | Shinichi Oki | 2002-06-04 |
YN
Yoshiro Nakata
Overall (2002): #85,644 of 266,432Top 35%
1
Patents 2002