Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6456382 | Interferometer that measures aspherical surfaces | Hiroshi Ichihara, Takashi Gemma, Hajime Ichikawa | 2002-09-24 |
| 6344898 | Interferometric apparatus and methods for measuring surface topography of a test surface | Takashi Gemma, Hiroshi Ichihara, Hajime Ichikawa, Bruce Jacobsen | 2002-02-05 |