Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492672 | Semiconductor device | Mizuki Segawa, Toshiki Yabu, Takashi Uehara, Takashi Nakabayashi, Takaaki Ukeda +2 more | 2002-12-10 |
| 6396943 | Defect inspection method and defect inspection apparatus | — | 2002-05-28 |