Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6459290 | Test apparatus of integrated circuit | Hideo Miyazawa, Hirozo Tanaka | 2002-10-01 |
| 6346822 | Semiconductor integrated circuit having diagnosis function | — | 2002-02-12 |
YN
Yoshikazu Nishikawa
Overall (2002): #34,188 of 266,432Top 15%
2
Patents 2002