Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6414483 | Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component | Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose | 2002-07-02 |