Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6446025 | Multiple propagation wave parameter measuring method and apparatus and machine-readable recording medium recording multiple propagation wave parameter measuring program | Yuki Nakamura, Yoshihiko Kuwahara, Tadashi Matsumoto | 2002-09-03 |