KY

Kazuki Yokota

NE Nec: 2 patents #192 of 1,934Top 10%
Overall (2002): #55,878 of 266,432Top 25%
2
Patents 2002

Issued Patents 2002

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6498401 Alignment mark set and method of measuring alignment accuracy — 2002-12-24
6477700 Reticle having discriminative pattern narrower in pitch than the minimum pattern width but wider than minimum width in the pattern recognition — 2002-11-05