Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6495856 | Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit | — | 2002-12-17 |
| 6496788 | Data processing method and apparatus to determine killer ratio based on a variety of defect types | — | 2002-12-17 |
| 6445145 | Display device | Satoshi Oosuga | 2002-09-03 |
| 6346435 | Laminated substrate fabricated from semiconductor wafers bonded to each other without contact between insulating layer and semiconductor layer and process of fabrication thereof | Tomohiro Hamajima | 2002-02-12 |