Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6483584 | Device for measuring the complex refractive index and thin film thickness of a sample | Solomon J. H. Lee, Chih-Kung Lee, Yang Yun-Chang, Lin Chan-Ching, Shuen-Chen Shiue | 2002-11-19 |