Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6469516 | Method for inspecting capacitors | Yoshinao Nishioka | 2002-10-22 |
| 6448525 | Capacitor characteristics measurement and packing apparatus | Yoshinao Nishioka, Masao Nishimura, Toshinari Tabata | 2002-09-10 |