Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6489791 | Build off self-test (Bost) testing method | — | 2002-12-03 |
| 6486691 | Tester for a semiconductor IC circuit having multiple pins | — | 2002-11-26 |
| 6393593 | Tester and method for testing LSI designed for scan method | — | 2002-05-21 |
| 6351836 | Semiconductor device with boundary scanning circuit | — | 2002-02-26 |