Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6492923 | Test system and testing method using memory tester | Masatoshi Maga, Hisayoshi Hanai, Shinji Yamada | 2002-12-10 |
TI
Takato Inoue
Ryoden Semiconductor System Engineering: 1 patents #14 of 48Top 30%
Overall (2002): #109,146 of 266,432Top 45%
1
Patents 2002