Shigeo Nishizono

Mitsubishi Electric: 2 patents #340 of 2,417Top 15%

Overall (2002): #41,787 of 266,432Top 20%

Patents 2002

Issued Patents 2002

Showing 1–2 of 2 patents

Patent #	Title	Co-Inventors	Date
6463805	Apparatus and method for measuring defect of sample	—	2002-10-15
6450035	Apparatus and method for measuring a defect of a sample	—	2002-09-17