Issued Patents 2002
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6500722 | Inductor recognition method, layout inspection method, computer readable recording medium in which a layout inspection program is recorded and process for a semiconductor device | Yoshiki Wada, Hiroshi Komurasaki, Shuji Yoshida | 2002-12-31 |
| 6492690 | Semiconductor device having control electrodes with different impurity concentrations | Shuichi Ueno, Yoshinori Okumura, Shigeto Maegawa | 2002-12-10 |
| 6486513 | Semiconductor device | Takuji Matsumoto | 2002-11-26 |
| 6465832 | Semiconductor device | Kazuya Yamamoto | 2002-10-15 |
| 6465292 | Method of manufacturing a semiconductor device having reduced power consumption without a reduction in the source/drain breakdown voltage | Yasuo Yamaguchi, Toshiaki Iwamatsu | 2002-10-15 |
| 6459125 | SOI based transistor inside an insulation layer with conductive bump on the insulation layer | Tadashi Nishimura, Kazuhito Tsutsumi, Shigeto Maegawa, Yuuichi Hirano | 2002-10-01 |
| 6452249 | Inductor with patterned ground shield | Yasuo Yamaguchi, Yuuichi Hirano, Takashi Ipposhi, Takuji Matsumoto | 2002-09-17 |
| 6441448 | Semiconductor storage device | Yasuo Yamaguchi, Hirotada Kuriyama | 2002-08-27 |
| 6436792 | Method of manufacturing semiconductor device | Yasuo Yamaguchi, Yuuichi Hirano | 2002-08-20 |
| 6429079 | Semiconductor device and manufacturing method thereof | Yuuichi Hirano | 2002-08-06 |
| 6426543 | Semiconductor device including high-frequency circuit with inductor | Shigeto Maegawa, Takashi Ipposhi, Toshiaki Iwamatsu | 2002-07-30 |
| 6424010 | Method of manufacturing a semiconductor device having reduced power consumption without a reduction in the source/drain breakdown voltage | Yasuo Yamaguchi, Toshiaki Iwamatsu | 2002-07-23 |
| 6420751 | Semiconductor device and method of manufacturing the same | Yasuo Yamaguchi, Hirotada Kuriyama, Shigeto Maegawa | 2002-07-16 |
| 6414353 | TFT with partially depleted body | Shigeto Maegawa | 2002-07-02 |
| 6383860 | Semiconductor device and method of manufacturing the same | Yasuo Inoue, Hirotada Kuriyama, Shigeto Maegawa, Kyozo Kanamoto, Toshiaki Iwamatsu | 2002-05-07 |
| 6358815 | Semiconductor device and method of manufacturing the same | — | 2002-03-19 |
| 6359804 | Static semiconductor memory cell formed in an n-well and p-well | Hirotada Kuriyama | 2002-03-19 |
| 6358820 | Method of manufacturing semiconductor device | — | 2002-03-19 |
| 6355957 | Semiconductor device having body potential fixing portion and closed-loop gate structure | Kazuya Yamamoto, Hiroshi Komurasaki | 2002-03-12 |
| 6339339 | TFT and reliability evaluation method thereof | — | 2002-01-15 |
| 6335267 | Semiconductor substrate and method of fabricating semiconductor device | Toshiaki Iwamatsu, Yasuo Yamaguchi, Takashi Ipposhi, Yuichi Hirano | 2002-01-01 |