SY

Shigehisa Yamamoto

Mitsubishi Electric: 3 patents #181 of 2,417Top 8%
Overall (2002): #20,891 of 266,432Top 8%
3
Patents 2002

Issued Patents 2002

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6470479 Method of verifying semiconductor integrated circuit reliability and cell library database — 2002-10-22
6404219 Burn-in test method for a semiconductor chip and burn-in test apparatus therefor — 2002-06-11
6372528 Burn-in method and burn-in device — 2002-04-16