Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486690 | Device under test board and testing method | Masahiko Hyozo | 2002-11-26 |
| 6356096 | Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path | Masahiro Ueda, Yoshinori Deguchi | 2002-03-12 |