Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6441606 | Dual zone wafer test apparatus | John Caldwell, James P. Nuxoll | 2002-08-27 |
| 6433570 | Modular design for an integrated circuit testing apparatus | Michael J. Sharpes | 2002-08-13 |