JV

Jorge L. de Varona

Micron: 1 patents #462 of 829Top 60%
📍 Boise, ID: #257 of 534 inventorsTop 50%
🗺 Idaho: #398 of 989 inventorsTop 45%
Overall (2002): #189,314 of 266,432Top 75%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6380555 Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor components David R. Hembree 2002-04-30