Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6489794 | High speed pass through test system and test method for electronic modules | — | 2002-12-03 |
| 6483329 | Test system, test contactor, and test method for electronic modules | — | 2002-11-19 |
| 6462568 | Conductive polymer contact system and test method for semiconductor components | — | 2002-10-08 |
| 6462575 | Method and system for wafer level testing and burning-in semiconductor components | — | 2002-10-08 |