Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6462565 | Measuring pattern for measuring width of wire in semiconductor device | Kang Sup SHIN, Jong-Il Kim | 2002-10-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6462565 | Measuring pattern for measuring width of wire in semiconductor device | Kang Sup SHIN, Jong-Il Kim | 2002-10-08 |