Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6480018 | Charge gain stress test circuit for nonvolatile memory and test method using the same | — | 2002-11-12 |
| 6335243 | Method of fabricating nonvolatile memory device | Woong Choi | 2002-01-01 |
| 6335553 | Nonvolatile semiconductor memory and method of fabrication | — | 2002-01-01 |