Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6476906 | Apparatus for measuring stress in a thin film and method of manufacturing a probe used therefor | Young Seok Kim, Jong-Ryul Jeong | 2002-11-05 |
SS
Sung Chul Shin
Overall (2002): #110,574 of 266,432Top 45%
1
Patents 2002