Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6429454 | Semiconductor device with test circuit | Nobuaki Otsuka, Osamu Hirabayashi, Yasushi Kameda | 2002-08-06 |
| 6408414 | Semiconductor device provided with a boundary-scan test circuit | — | 2002-06-18 |