MN

Mehrdad Nikoonahad

KL Kla-Tencor: 1 patents #9 of 42Top 25%
📍 Peekskill, NY: #20 of 44 inventorsTop 50%
🗺 New York: #3,002 of 9,277 inventorsTop 35%
Overall (2002): #155,713 of 266,432Top 60%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6411390 Interferometric system for measurement disturbance of a sample John Jiang 2002-06-25