Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6493645 | Method for detecting and classifying scratches occurring during wafer semiconductor processing | — | 2002-12-10 |
TH
Thomas Hladschik
Overall (2002): #104,092 of 266,432Top 40%
1
Patents 2002