Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6477095 | Method for reading semiconductor die information in a parallel test and burn-in system | Mark Daniel Eubanks | 2002-11-05 |
| 6404250 | On-chip circuits for high speed memory testing with a slow memory tester | Joerg Volrath, Mark Daniel Eubanks | 2002-06-11 |