Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6490702 | Scan structure for improving transition fault coverage and scan diagnostics | Richard F. Rizzolo, Franco Motika, Ulrich Baur | 2002-12-03 |
| 6453436 | Method and apparatus for improving transition fault testability of semiconductor chips | Richard F. Rizzolo | 2002-09-17 |
| 6442720 | Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis | Timothy J. Koprowski, Mary P. Kusko, Richard F. Rizzolo | 2002-08-27 |