CA

Charles N. Archie

IBM: 1 patents #1,916 of 5,400Top 40%
📍 Granite Springs, NY: #1 of 2 inventorsTop 50%
🗺 New York: #3,002 of 9,277 inventorsTop 35%
Overall (2002): #244,519 of 266,432Top 95%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6472662 Automated method for determining several critical dimension properties from scanning electron microscope by using several tilted beam or sample scans 2002-10-29