CS

Carlos Strocchia-Rivera

📍 Highland, NY: #7 of 15 inventorsTop 50%
🗺 New York: #3,002 of 9,277 inventorsTop 35%
Overall (2002): #244,873 of 266,432Top 95%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6462817 Method of monitoring ion implants by examination of an overlying masking material — 2002-10-08