Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6397153 | Testing system and testing method for structure | Wataru Yamagishi, Toshihiko Horiuchi, Masahiko Inoue, Kazuhiro Umekita | 2002-05-28 |
| 6341258 | Shaking test apparatus and method for structures | Masahiko Inoue, Toshihiko Horiuchi, Takao Konno, Wataru Yamagishi | 2002-01-22 |