Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6404911 | Semiconductor failure analysis system | Kazuko Ishihara, Seiji Ishikawa, Masao Sakata, Yoshiyuki Miyamoto, Jun Nakazato | 2002-06-11 |
| 6339653 | Inspection data analyzing system | Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more | 2002-01-15 |