Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6381299 | X-ray examination apparatus and imaging method of X-ray image | Rika Baba, Ken Ueda, Hiroyuki Kawai, Koichi Koike, Akira Kuba +1 more | 2002-04-30 |
| 6377656 | X-ray control method and x-ray apparatus | Ken Ueda, Akira Kuba | 2002-04-23 |