Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6438209 | Apparatus for guiding X-rays | — | 2002-08-20 |
| 6370221 | Method of setting a position of an object of measurement in layer thickness measurement by X-ray fluorescence | Karl-Heinz Kaiser | 2002-04-09 |
| 6364528 | Determination of the measuring spot during x-ray fluorescence analysis | — | 2002-04-02 |