Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6392433 | Method and apparatus for testing semiconductor devices | Kenji Itasaka, Terumi Kamifukumoto, Yuji Akasaki | 2002-05-21 |
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Nobuo Ooyama
Overall (2002): #145,185 of 266,432Top 55%
1
Patents 2002