Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6408411 | Two pass multi-state parallel test for semiconductor device | Brian L. Brown, Jackson Leung, Pow Cheah Chang | 2002-06-18 |
| 6381718 | Current controlled multi-state parallel test for semiconductor device | Brian L. Brown, Jackson Leung, Pow Cheah Chang | 2002-04-30 |