Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6476630 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Benjamin N. Eldridge | 2002-11-05 |
| 6456099 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2002-09-24 |
| 6429029 | Concurrent design and subsequent partitioning of product and test die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2002-08-06 |