Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6399944 | Measurement of film thickness by inelastic electron scattering | Leonid A. Vasilyev, Charles E. Bryson, III, Sergey Borodyansky, Dmitri Klyachko | 2002-06-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6399944 | Measurement of film thickness by inelastic electron scattering | Leonid A. Vasilyev, Charles E. Bryson, III, Sergey Borodyansky, Dmitri Klyachko | 2002-06-04 |