Issued Patents 2002
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486492 | Integrated critical dimension control for semiconductor device manufacturing | — | 2002-11-26 |
| 6456736 | Automatic field sampling for CD measurement | Zoe Osborne | 2002-09-24 |
| 6421457 | Process inspection using full and segment waveform matching | — | 2002-07-16 |
| 6388253 | Integrated critical dimension control for semiconductor device manufacturing | — | 2002-05-14 |
| 6370023 | Case assembly for computer mainframe | — | 2002-04-09 |