YS

Yoshiro Shiokawa

AN Anelva: 2 patents #4 of 56Top 8%
Overall (2002): #34,086 of 266,432Top 15%
2
Patents 2002

Issued Patents 2002

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6479814 Ion source for ion attachment mass spectrometry apparatus Megumi Nakamura, Toshihiro Fujii 2002-11-12
6399213 Surface treated vacuum material and a vacuum chamber having an interior surface comprising same 2002-06-04