Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6475827 | Method for making a semiconductor package having improved defect testing and increased production yield | Tae Heon Lee | 2002-11-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6475827 | Method for making a semiconductor package having improved defect testing and increased production yield | Tae Heon Lee | 2002-11-05 |