Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6377901 | Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time | David T. Crook | 2002-04-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6377901 | Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time | David T. Crook | 2002-04-23 |