Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6467051 | Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test | Rodney A. Browen, William P. Darbie, John E. McDermid, Kay C. Lannen | 2002-10-15 |