Issued Patents 2002
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6366081 | Method and apparatus for high throughput media defect testing using true reference value | Thomas Yun Fook Liew, Teck Ee Loh, Udaya Silva | 2002-04-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6366081 | Method and apparatus for high throughput media defect testing using true reference value | Thomas Yun Fook Liew, Teck Ee Loh, Udaya Silva | 2002-04-02 |